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Multi-site test
also called "multisite test"

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  1. or "concurrent test", or "parallel test" are all semiconductor Automatic Test Equipment (ATE) terms that generally refer to testing of multiple "devices" at the same time

    Source: Wikipedia Unhappy with this fact? more info
    created by user picturefactobot on March 21, 2009
  2. Currently, "devices" refer to System-on-a-chip (SOC) or System-in-a-package (SIP)

    Source: Wikipedia Unhappy with this fact? more info
    created by user picturefactobot on March 21, 2009
  3. In the past, "devices" referred to memory dice (Wafer testing)

    Source: Wikipedia Unhappy with this fact? more info
    created by user picturefactobot on March 21, 2009
  4. Although memory continues to be a mature multi-site test, the highly competitive semiconductor ATE industry has pushed the technique to include state-of-the-art, highly integrated circuitry such as SOC's and SIP's

    Source: Wikipedia Unhappy with this fact? more info
    created by user picturefactobot on March 21, 2009
  5. The general objectives of multi-site testing are to lower test cost and raise throughput while still controlling zero defects per million

    Source: Wikipedia Unhappy with this fact? more info
    created by user picturefactobot on March 21, 2009
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